The software-controlled rotation axis PS3270, in combination with a motorized horizontal axis, moves samples precisely to the required position. Rapidly created software procedures incorporate the table movement into fully automated sample analyses such as determining the surface free energy. Position-dependent measurements of the contact angle (mapping) can be carried out just as easily, for example for checking the homogeneity of a surface.
As ideal supplements for the rotation table, the ST3210 vacuum table for soft and bendable samples and/or the ST3271 wafer tabletop for the analysis of wafer surfaces are available.
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